AM018T wafer inspection system is a fast, accurate and comprehensive solution allowing you to detect and sort wafers by size, thickness, stain, chipping, resistivity, micro crack, P/N type, hole, etc.
Suitable for
166-230mm wafer
The pioneer of wafer sorting system in domestic market
Leveraging the excellent inspection performance and reliable automation, the inspection system gained good reputation and became the first choice of global customers.
Smart system
Its concise HMI interface makes operation more convenient. It is equipped with self-diagnosis function and provides more comprehensive alarm information
Function design
It has the function of damaged wafer collection and unload failure detection to improve the equipment stability and uptime
AI intelligent inspection
The combination of AI algorithm and traditional algorithm for Stain, Micro-crack and Chipping inspection makes the test result measureable, stable and reliable.
Flexible extension
Experienced in tailored solution, we can design the wafer loading and unloading method according to the needs of customer. Automatic supporting equipment is optional for wafer unloading.
+86-0510-81816658
sales@gcsy-sh.com
No.3 Xinhua Road,
